Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. V [1]. Oxygen
- 1 September 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 53, 341-344
- https://doi.org/10.1016/0020-7381(83)85127-4
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Secondary ion mass spectrometry of low-temperature solidsInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. IV [1]. Carbon dioxide, carbonyl sulfide and carbon disulfideInternational Journal of Mass Spectrometry and Ion Physics, 1982
- Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. 3. Nitrogen oxidesJournal of the American Chemical Society, 1982
- Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. 2. Rare gas solidsJournal of the American Chemical Society, 1981
- Secondary ion mass spectrometry of molecular solids: a source of cluster ionsJournal of the American Chemical Society, 1981
- Ejection dynamics and electronic processes governing secondary particle emission in SIMSJournal of the American Chemical Society, 1981
- Secondary ion mass spectrometry of small-molecule solids at cryogenic temperatures. 1. Nitrogen and carbon monoxideJournal of the American Chemical Society, 1981
- Secondary ion mass spectra of some simple organic moleculesJournal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases, 1980
- Secondary ion mass spectrometry of molecular solids. Cluster formation during ion bombardment of frozen water, benzene, and cyclohexaneJournal of the American Chemical Society, 1979