Signal processing in the reflective acoustic microscope
- 20 July 1978
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 14 (15) , 472-473
- https://doi.org/10.1049/el:19780317
Abstract
We describe a new technique to enhance the image in the scanning acoustic microscope in the reflection mode. We use a 20 ns pulse modulated r.f. signal and a sampling oscilloscope to separate the incident signal from the reflected signal. The resulting image shows up details that are of the order of one micrometre with a good signal/noise ratio. We can further improve this resolution by phase measurements.Keywords
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