Reflectometry by a resistive network at VHF
- 1 May 1988
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 21 (5) , 456-460
- https://doi.org/10.1088/0022-3735/21/5/008
Abstract
This study is concerned with a method of reflectometry for the testing and characterisation of two-terminal networks in a frequency band that stretches over more than three decades (0.3-500 MHz). The device is a resistive network, provided with a wide-band high-sensitivity detector, as well as low-noise and low-frequency electronics for the measurement of the moduli of incident reflected and total waves. Consequently the characteristics of all two-terminal networks are determined on a broad band of frequencies in less than one second.Keywords
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