Characterisation of thin films of bismuth oxide by X-ray photoelectron spectroscopy
- 1 January 1982
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 25 (2) , 181-189
- https://doi.org/10.1016/0368-2048(82)85016-0
Abstract
No abstract availableThis publication has 26 references indexed in Scilit:
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