Very high resolution soft x-ray spectrometer for an electron beam ion trap

• 1 January 1997
• journal article
• Published by AIP Publishing in Review of Scientific Instruments
• Vol. 68  (1) , 1077-1079
• https://doi.org/10.1063/1.1147791

Abstract

Keywords

• PARTICLE TRAPS
• MAGNESIUM
• POSITIVE IONS
• TRAPS
• X-RAY SPECTROMETERS
• FABRICATION
• SOFT X RADIATION
• MAGNESIUM IONS
• PLASMA DIAGNOSTICS
• ELECTRON BEAMS
• X-RAY SPECTRA
• RESOLUTION
• DESIGN
• OPERATION
• ION TEMPERATURE
• TRAPPING