An International Direct Comparison of Two Josephson-Effect Voltage Standards
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 27 (4) , 470-474
- https://doi.org/10.1109/tim.1978.4314742
Abstract
A direct comparison of the Bureau International des Poids et Mesures (BIPM) and the National Physical Laboratory (NPL) Josephson-effect voltage standards has been accomplished by transporting the BIPM apparatus to the NPL during April 1978. The voltage of a saturated standard cell as measured by the BIPM system, V(BIPM), was found to differ from that measured by the NPL system, V(NPL), such that [V(BIPM) - V(NPL)]/V(BIPM) = 7 ± 2 × 10-8. This difference is 1.6 times the total expected one-standard deviation uncertainty for the combined systems. Direct comparison of the two 2e/h systems without an intermediate standard cell was also accomplished and is reported for the first time.Keywords
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