Raman spectroscopic and atomic force microscopic study of graphite ablation at 193 and 248 nm
- 1 February 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 154-155, 22-28
- https://doi.org/10.1016/s0169-4332(99)00473-0
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
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