Instrumentation for low-energy electron diffraction
- 1 October 1983
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 54 (10) , 1273-1288
- https://doi.org/10.1063/1.1137259
Abstract
Recent developments in instrumentation for low‐energy electron diffraction(LEED) are reviewed. After a summary of the major types of measurements in LEED, the properties of LEED instruments that are important in performing these measurements are described. A detailed discussion is presented on the major components of a LEEDdiffractometer.LEED is compared briefly to some other techniques that are sensitive to surface structure.Keywords
This publication has 58 references indexed in Scilit:
- The present status of low-energy electron diffractionApplications of Surface Science, 1982
- Comparison of high energy ion beam and electron beam surface probesApplications of Surface Science, 1982
- LEED studies of surface imperfectionsApplications of Surface Science, 1982
- Simple spot photometer for LEED intensity measurementsJournal of Vacuum Science and Technology, 1982
- Surface rearrangement of adsorbate-covered Mo(001)Journal of Vacuum Science and Technology, 1981
- Low‐energy electron diffraction from inert gas overlayersJournal of Vacuum Science and Technology, 1977
- Use of a Vidicon camera for the measurement of LEED beam intensities by the photographic methodJournal of Vacuum Science and Technology, 1976
- New rapid and accurate method to measure low-energy-electron-diffraction beam intensities: The intensities from the clean Pt (111) crystal facePhysical Review B, 1975
- Double Grid Repeller System to Improve Electron Resolution in Low Energy Electron Diffraction EquipmentReview of Scientific Instruments, 1965
- A New Type of Apparatus for Experiments in Secondary Electron DiffractionReview of Scientific Instruments, 1933