Computation of contrasts in atomic resolution electron spectroscopic images of planar defects in crystalline specimens
- 30 April 2000
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 81 (3-4) , 223-233
- https://doi.org/10.1016/s0304-3991(99)00195-3
Abstract
No abstract availableKeywords
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