Measurements of the normal-incidence X-ray reflectance of a molybdenum-silicon multilayer deposited on a 2000 l/mm grating
- 1 April 1990
- journal article
- Published by IOP Publishing in Physica Scripta
- Vol. 41 (4) , 396-399
- https://doi.org/10.1088/0031-8949/41/4/003
Abstract
No abstract availableKeywords
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