Evolution of Surface Roughness of a Strained Epitaxial Film Due to Interface Misfit Dislocations
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Instability of a biaxially stressed thin film on a substrate due to material diffusion over its free surfaceJournal of the Mechanics and Physics of Solids, 1993
- The Mechanics of Dislocations in Strained-Layer Semiconductor MaterialsPublished by Elsevier ,1993
- A Model for Strain-Induced Roughening and Coherent Island GrowthEurophysics Letters, 1992
- Overview no. 86Acta Metallurgica, 1989
- Structure and recombination in InGaAs/GaAs heterostructuresJournal of Applied Physics, 1988
- Morphological Transitions in Solid Expitaxial OverlayersEurophysics Letters, 1987
- On the thermodynamics of crystalline solidsThe Journal of Chemical Physics, 1985
- Energy Variations in Diffusive Cavity GrowthJournal of the American Ceramic Society, 1981
- A linear theory of thermochemical equilibrium of solids under stressActa Metallurgica, 1973