Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy

• 1 December 1998
• journal article
• Published by Trans Tech Publications, Ltd. in Solid State Phenomena
• Vol. 63-64, 151-158
• https://doi.org/10.4028/www.scientific.net/ssp.63-64.151

Abstract

Keywords

• GAAS QUANTUM WIRE
• GALLIUM NITRIDE (GAN)
• SPATIALLY RESOLVED MICRO PHOTOLUMINESCENCE