Refracted power technique for cutoff wavelength measurement in single-mode waveguides
- 28 August 1980
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 16 (18) , 695-696
- https://doi.org/10.1049/el:19800493
Abstract
A technique to measure the local (2–3 mm) values of cutoff wavelength λc in single-mode waveguides is described. The technique, insensitive to the length of waveguide used, involves the spectral measurement of refracted power. The feasibility of using the cutoff wavelength determined by this technique to predict the zero dispersion wavelength is also studied.Keywords
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