A simple specimen straining device for the scanning electron microscope
- 15 May 1969
- journal article
- other
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (5) , 444-446
- https://doi.org/10.1088/0022-3735/2/5/424
Abstract
A simple straining device has been developed for use with the Cambridge Instrument Company's Stereoscan scanning electron microscope. The device replaces the normal specimen holder and no modifications to the stage are required. The effect of stress on the surface topography of fibres and other specimens may be observed directly on the display screen.Keywords
This publication has 1 reference indexed in Scilit:
- A new preparation technique for examination of polymers in the scanning electron microscopeJournal of Physics E: Scientific Instruments, 1968