Dislocation Stresses in a Thin Film Due to the Periodic Distributions of Dislocations
- 1 January 1972
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (1) , 182-188
- https://doi.org/10.1063/1.1660804
Abstract
The state of stresses and displacements in thin films due to the presence of a periodic distribution of screw dislocations and edge dislocations is investigated by the method of continuously distributed dislocations and the three‐dimensional theory of elasticity. The dislocations are straight and pierce obliquely the surfaces of the thin films in both cases. As a special case the exact solution is presented for a straight‐edge dislocation piercing normally the surfaces of the films. Emphasis is placed upon the stress relaxation caused by the presence of free surfaces. The result will be useful for the contrast study of dislocation images in electron microscopy.This publication has 6 references indexed in Scilit:
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