Charging of spacecraft materials simulated in a scanning electron microscope
- 15 November 1973
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 9 (23) , 544-546
- https://doi.org/10.1049/el:19730401
Abstract
The scanning electron microscope has been used to apply electric charge to spacecraft insulating materials, and to photograph the resulting patterns of charge distribution. Anomalies, possibly microscopic discharges, have been observed, usually associated with strong differential charging between adjacent regions of the same material. In thin materials, electron-beam penetration, temporarily induced conductivity and permanent subsurface damage have been identified.Keywords
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