New Probe of Line Broadening with Resolvable Fine Structure: The "Off-Diagonal Strength Function"
- 14 August 1978
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 41 (7) , 454-457
- https://doi.org/10.1103/physrevlett.41.454
Abstract
A recently developed technique enables one to measure the relative sign of inelastic proton-channel amplitudes of resonances. Using this we have measured signs of 32 fine-structure levels in the vicinity of the analog state seen in the reaction + at MeV. Thereby we construct a new type of datum, "the off-diagonal strength function," and compare this with the prediction made by the theory of analog-state broadening. This prediction involves no unknown parameters, and so the degree of fit provides an excellent test of the theory.
Keywords
This publication has 4 references indexed in Scilit:
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- Fine structure of analogue statesPhysics Reports, 1976
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- Fine structure of analogue states in 45ScNuclear Physics A, 1975