In-Situ Scanning Tunneling Microscopy of Semiconductor(n-TiO2)/Liquid Interfaces. A Role of Band Bending in Semiconductors
- 1 February 1989
- journal article
- Published by Oxford University Press (OUP) in Chemistry Letters
- Vol. 18 (2) , 285-288
- https://doi.org/10.1246/cl.1989.285
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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