Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 μ

13 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 61-62
https://doi.org/10.1109/vlsic.2001.934195

Abstract

This paper describes an experiment to characterize soft error rate of static latches for neutrons using a neutron beam, with measured soft error rates as a function of diffusion collection areas and supply voltages. The paper also quantifies the effectiveness of two promising hardening techniques and scaling trends.

Keywords

COSMIC RAYS
CAPACITANCE
CLOCKS
ERROR ANALYSIS
NEUTRONS
VOLTAGE
TESTING
MICROPROCESSORS
PARTICLE BEAMS
PACKAGING

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