Rotation between SEM micrograph and electron channelling patterns
- 1 January 1975
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 8 (1) , 15
- https://doi.org/10.1088/0022-3735/8/1/008
Abstract
Describes a 180 degrees rotation effect which occurs between the scanning electron microscope (SEM) micrograph and the corresponding electron channeling patterns (ECP). The effect occurs in both the normal double deflection mode used for large area ECPS and the deflection focusing technique used for selected area ECPS. The cause of the effect is explained.Keywords
This publication has 1 reference indexed in Scilit:
- Rotation between micrographs from the scanning electron microscope and electron channelling patternsJournal of Physics E: Scientific Instruments, 1974