Numerical Analysis of Hot-Electron Effects in GaAs MESFETs

Publisher Website

1 January 1995

book chapter
Published by Springer Nature

p. 294-297
https://doi.org/10.1007/978-3-7091-6619-2_71

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

High-voltage electron-beam-induced-current imaging of microdefects in laser diodes and MESFETs
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1994
Rapid Degradation of WSi Self-Aligned Gate GaAs MESFET by Hot Carrier Effect
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1992