Some Effects of Field Perturbation Upon Cavity-Resonance and Dispersion Measurements on MIC Dielectrics
- 1 November 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 25 (11) , 892-903
- https://doi.org/10.1109/tmtt.1977.1129237
Abstract
No abstract availableKeywords
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