An advanced method for studying electrotransport in thin films using electrical resistance
- 16 May 1970
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 2 (1) , K1-K4
- https://doi.org/10.1002/pssa.19700020122
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMSApplied Physics Letters, 1968