Determination of the Thickness and Refractive Index of Cu2O Thin Film Using Thermal and Optical Interferometry
- 16 February 1986
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 93 (2) , 613-620
- https://doi.org/10.1002/pssa.2210930226
Abstract
No abstract availableKeywords
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