Electronic Structure of Metallic Glasses from the Cu-Zr-and Cu-Ti-Systems as well as from some Transitionmetall-Metalloid- Systems by Means of X-Ray-Emission Spectroscopy

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Abstract
Using an electron microprobe, the position and shape of the characteristic X-Ray emission lines from the elements Cu, Zr, Ti, Fe, Co, and Mn in metallic glasses of the systems Cu-Zr, Cu-Ti, Fe-B, Fe-P, Co-B, Co-P, Fe-Ge-P, Mn-Si-P, and Fe-Si-P were studied. In each case the lines were compared with those of either the crystalline element or the corresponding crystalline compound. Compared to electron spectroscopy methods such as XPS or UPS, the method used during this work has the advantage that the spectra obtained are specific for the corresponding element. The general trend of the results can be described in such a way that the energy of binding of the electrons to the corresponding atomic species is larger in the amorphous state than in the crystalline element, whereas the energy of binding of the electrons in the amorphous state is similar to that of the corresponding crystalline compound.

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