Single crystal optic elements for helium atom microscopy

Abstract
Focusing characteristics of asymmetrically bent single crystal mirrors are discussed in the context of fabricating an optic element for an helium atom microscope. We demonstrate the principle that deforming a clamped, elliptical, single crystal under electrostatic pressure can produce submicron focusing of an helium beam. We present a systematic procedure that may be used to fabricate high precision mirrors close to the Cartesian ideal of any chosen optical configuration. In particular, imaging systems with asymmetric mirror profiles are discussed. Results are independent of crystal characteristics and can be adapted to fit a range of experimental geometries. The calculations indicate that mirror-induced aberrations can be eliminated to fourth order by use of a single actuation electrode in an ideal system.