A New Method of Measuring Dielectric Property of Very-High-Loss Materials at High Frequencies
- 1 January 1970
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 19 (1) , 73-77
- https://doi.org/10.1109/tim.1970.4313861
Abstract
This paper presents a circuit system functioning as a capacitance meter suitable for very-high-loss material with a wide range of application in various fields of scientific research and industrial operation. The minimum equivalent parallel resistance of the specimen to be measured reaches as low as 50 ohms and the measuring range of capacitance is from about 0.1 ~ 1000 pF at 2 MHz. Some experimental data are given for the appreciation of its characteristics.Keywords
This publication has 3 references indexed in Scilit:
- Continuous Measurement of Concentration Using a Highly Stabilized Reactance MeterReview of Scientific Instruments, 1967
- Contactless Measurement of Resistivity of Slices of Semiconductor MaterialsReview of Scientific Instruments, 1967
- On the New Method of Measuring Dielectric Constant and Loss Angles of SemiconductorsJournal of Applied Physics, 1953