Mechanical properties and microstructures of Al-1%Si thin film metallizations
- 1 July 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 150 (2-3) , 237-244
- https://doi.org/10.1016/0040-6090(87)90095-2
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Hall-petch relation in thin film metallizationsScripta Metallurgica, 1986
- A positron study of precipitation phenomena in AlGe and AlSi alloysActa Metallurgica, 1986
- ELECTROMIGRATION IN THIN FILMS : THE EFFECT OF SOLUTE ATOMS ON GRAIN BOUNDARY DIFFUSIONLe Journal de Physique Colloques, 1975
- Electromigration Damage in Aluminum Film ConductorsJournal of Applied Physics, 1970