Digital enhancement and analysis of TEM plates
- 30 June 1981
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 98 (3) , 329-337
- https://doi.org/10.1016/0022-3115(81)90159-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Multilevel Approach to Sequential Detection of Pictorial FeaturesIEEE Transactions on Computers, 1976
- A Class of Algorithms for Fast Digital Image RegistrationIEEE Transactions on Computers, 1972
- What is the fast Fourier transform?IEEE Transactions on Audio and Electroacoustics, 1967