Zinc oxide on silicon memory cells scanned by acoustic surface waves
- 15 February 1975
- journal article
- conference paper
- Published by AIP Publishing in Applied Physics Letters
- Vol. 26 (4) , 137-139
- https://doi.org/10.1063/1.88119
Abstract
The use of parametrically mixed acoustic surface waves to remotely scan and process the contents of zinc−oxide−on−silicon charge storage cells is demonstrated. The write, erase, and store characteristics of the memory cells are investigated. The signal−processing capability of the device is illustrated by the correlation of a line of stored information with a biphase coded input signal.Keywords
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