Structural characterization and isomer differentiation of chalcones by electrospray ionization tandem mass spectrometry

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Abstract
A series of chalcones were characterized by electrospray ionization tandem mass spectrometry (MSn). Several ionization modes were evaluated, including protonation, deprotonation and metal complexation, with metal complexation being the most efficient. Collision‐activated dissociation (CAD) was used to characterize the structures, and losses commonly observed include H2, H2O, CO and CO2, in addition to methyl radicals for the methoxy‐containing chalcones. CAD of the metal complexes, especially [CoII (chalcone—H) 2,2′‐bipyridine]+, allowed the most effective differentiation of the isomeric chalcones with several diagnostic fragment ions appearing upon activation of the metal complexes. MSn experiments were performed to support identification of some fragment ions and to verify the proposed fragmentation pathways. In several cases, MSn indicated that specific neutral losses occurred by stepwise pathways, such as the neutral loss of 44 u as CH3· and HCO·, or CH4 and CO, in addition to CO2. Copyright © 2003 John Wiley & Sons, Ltd.