Hemispherical–directional reflectance measurements of natural snow in the 0.9–1.45 μm spectral range: comparison with adding–doubling modelling

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Abstract
The authors present the results of snow hemispherical–directional reflectance measurements on natural snow in the 0.9–1.45 μm spectral range. The measurements were made in a cold laboratory on snow collected in the field. Some of the samples have been subjected to controlled metamorphism in the laboratory before measurements were made. In the first part, the adding–doubling model, experimental assumptions and methodology are described. In the second part, experimental results are discussed and compared with theoretical values for different typical snow types and for different stages of snow evolution when subjected to temperature-gradient and wetness metamorphisms.