Low-energy-electron probing depths in metals

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Abstract
Thin-film techniques are used in conjunction with spin-polarized electron-energy-loss spectroscopy to measure directly the probing depth of low-energy (∼30 eV) electrons in metals. The data indicate the probing depth in molybdenuum is small (∼1 monolayer) but that it is significantly higher for copper (∼3 monolayers). These differences are consistent with a model in which inelastic scattering is attributed to electron-hole pair excitation. Effects are also observed that might be interpreted in terms of scattering at the interface between substrate and overlayer.