Leaf wall yield threshold of field‐grown soybean measured by vapour pressure psychrometry
- 1 June 1989
- journal article
- research article
- Published by Wiley in Plant, Cell & Environment
- Vol. 12 (4) , 441-447
- https://doi.org/10.1111/j.1365-3040.1989.tb01960.x
Abstract
No abstract availableKeywords
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