Principal component analysis of Auger line shapes at solid—solid interfaces
- 28 February 1981
- journal article
- Published by Elsevier in Applications of Surface Science
- Vol. 7 (1-2) , 7-18
- https://doi.org/10.1016/0378-5963(81)90056-8
Abstract
No abstract availableKeywords
This publication has 23 references indexed in Scilit:
- Quantitative determination of surface composition of sulfur bearing anion mixtures by Auger electron spectroscopyAnalytical Chemistry, 1980
- The influence of ion sputtering on the elemental analysis of solid surfacesThin Solid Films, 1979
- Thermal decomposition of nickel carbide: an Auger lineshape studyJournal of Vacuum Science and Technology, 1979
- Chemical Information in Auger SpectroscopyIndustrial & Engineering Chemistry Product Research and Development, 1979
- Application of Auger electron spectroscopy to studies of the silicon/silicide interfaceJournal of Vacuum Science and Technology, 1978
- A new approach to identifying chemical states, comprising combined use of Auger and photoelectron linesJournal of Electron Spectroscopy and Related Phenomena, 1977
- Factor analysis of the mass spectra of mixturesAnalytical Chemistry, 1976
- Auger parameter in electron spectroscopy for the identification of chemical speciesAnalytical Chemistry, 1975
- Principal-component analysis applied to chromatographic dataAnalytical Chemistry, 1972
- Determination of the number of species present in a system. New matrix rank treatment of spectrophotometric dataThe Journal of Physical Chemistry, 1971