Repeatability Issues for De-Embedding Microstrip Discontinuity S-Parameter Measurements by the TSD Technique
- 1 June 1986
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Better Microstrip ConnectorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Highly Accurate Design of Spiral Inductors for MMIC's with Small Size and High Cut-Off Frequency CharacteristicsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- De-Embedding Microstrip DiscontinuitiesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978