Modeling the Impact of Body-to-body Leakage in Partially-Depleted SOI CMOS Technology
- 1 January 2001
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Finite-Element Analysis of Semiconductor Devices: The FIELDAY ProgramIBM Journal of Research and Development, 1981
- Theory of TunnelingJournal of Applied Physics, 1961