Solid-state micrologic elements

• 1 January 1960
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• Vol. III, 82-83
• https://doi.org/10.1109/isscc.1960.1157264

Abstract

Keywords

• SOLID STATE CIRCUITS
• PACKAGING
• COMPUTER AIDED MANUFACTURING
• LOGIC TESTING
• ASSEMBLY
• LOGIC FUNCTIONS
• LIFE TESTING
• MILITARY COMPUTING
• COST FUNCTION
• SHIFT REGISTERS