Four-Probe Device for Accurate Measurement of Temperature Dependence of Electrical Resistivity on Small, Irregularly Shaped Single Crystals With Parallel Sides

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Abstract
A sample holder is described that considerably facilitates the measurement of specific resistivity on small, irregularly shaped single crystals over a large range of temperature. Utilizing the van der Pauw technique, accurate values of this electrical transport parameter have been obtained without loss of contact at temperatures as low as 4.2°K. The essential advantage of this holder is its simplicity which eliminates the necessity of specialized techniques for accurate measurements on irregular crystals as small as 1 mm.

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