Scanning electron microscope observation of single defects in solid crystalline materials
- 1 January 1979
- Vol. 2 (4) , 217-224
- https://doi.org/10.1002/sca.4950020403
Abstract
No abstract availableFunding Information
- Délégation Générale à la „Recherche - Scientificienne et Technique”︁ (17 CCM)
This publication has 4 references indexed in Scilit:
- Electron–channelling imaging in scanning electron microscopyPhilosophical Magazine A, 1979
- Low-Loss Image for Surface Scanning Electron MicroscopeApplied Physics Letters, 1971
- Effects of surface stress relaxation on the electron microscope images of dislocations normal to thin metal foilsPhilosophical Magazine, 1964
- Crystallographic imperfections in siliconDiscussions of the Faraday Society, 1964