Measurement of Barrier Heights of Semiconductor/Liquid Junctions Using a Transconductance Method: Evidence for Inversion at n-Si/CH3OH-1,1'-Dimethylferrocene+/0 Junctions
- 1 September 1994
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 98 (35) , 8765-8774
- https://doi.org/10.1021/j100086a029
Abstract
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