Numerical Evaluation of Electron Image Phase Contrast
- 1 February 1965
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 44 (2) , 207-233
- https://doi.org/10.1002/j.1538-7305.1965.tb01658.x
Abstract
This paper is concerned with phase contrast in electron images with emphasis on a periodic scattering object. The Kirchoff diffraction or imaging integral over the back focal plane is formulated in terms of the amplitude and phases of the scattered w...Keywords
This publication has 4 references indexed in Scilit:
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- A new calculation of electron scattering cross sections and a theoretical discussion of image contrast in the electron microscopeProceedings of the Physical Society, 1962
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949
- Applications of the method of impact parameter in collisionsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1933