Design and performance of high-reliability double-layer capacitors
- 4 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 289-297 vol.1
- https://doi.org/10.1109/ectc.1990.122204
Abstract
The development, testing, and use of a highly reliable double-layer capacitor component designed for operation in the range of -55 degrees to 85 degrees C are described. This component offers a welded tantalum package with an innovative design to provide long life with stable electrical performance. Details of the design are presented along with life- and stress-test data. Unique characteristics are discussed and simple equivalent circuit models are described to assist application engineers in the optimal use of this component. Test results show the following: (1) >2000-h life at 85 degrees C and rated voltage; (2) > 20000 surge current cycles at 85 degrees C; (3) >1000-h life at 85 degrees C under 125% voltage stress conditions; and (4) >700-h operating life at 95 degrees C temperature stress conditions.<>Keywords
This publication has 1 reference indexed in Scilit:
- AC IMPEDANCE STUDY OF POROUS CARBON COLLECTORS FOR Li/SO2, PRIMARY CELLSChemical Engineering Communications, 1985