Model construction and parameter effect for TFT-LCD process based on yield analysis by using ANNs and stepwise regression
- 31 January 2008
- journal article
- Published by Elsevier in Expert Systems with Applications
- Vol. 34 (1) , 717-724
- https://doi.org/10.1016/j.eswa.2006.10.014
Abstract
No abstract availableKeywords
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