Electrostatic Gate Protection using an Arc Gap Device

• 1 April 1973
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• No. 07350791,p. 198-202
• https://doi.org/10.1109/irps.1973.362596

Abstract

Keywords

• ELECTROSTATICS
• PROTECTION
• VOLTAGE
• MOS DEVICES
• DIODES
• TESTING
• DIELECTRICS
• RESISTORS
• LABORATORIES
• IMPEDANCE