Fractal analysis and stereological evaluation of microstructures

Abstract
SUMMARY: Fractal properties and the concept of fractal dimension has been studied. Emphasis is given to the applicability in structure analysis. Comparison between different measurement procedures, analyses of mathematically defined lines and surfaces as well as measurements on real surfaces have been performed. The stereological consequences have been considered.A restrictive use of the fractal analysis results as an indicator of size, shape and self‐similarity is recommended. If results obtained by quantitative microscopy at different magnification‐resolution levels are to be compared, fractal analysis may be of advantage. The actual choice of resolution should yet be determined from the physical relevance of the geometrical details.