Presence of mobility-fluctuation 1f noise identified in silicon P+NP transistors
- 31 January 1983
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 26 (1) , 71-74
- https://doi.org/10.1016/0038-1101(83)90163-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Proposed discrimination between 1/f noise source in transistorsSolid-State Electronics, 1982
- Experimental studies on 1/f noiseReports on Progress in Physics, 1981
- A review of some charge transport properties of siliconSolid-State Electronics, 1977
- Current-voltage relations and equivalent circuits of transistors at high injection levelsSolid-State Electronics, 1974
- Discussion of recent experiments on 1/ƒ noisePhysica, 1972
- Flicker noise in transistorsIEEE Transactions on Electron Devices, 1963