Evaluation of system performance of near-infrared imaging devices

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Abstract
A method is described for the evaluation of the performance of near-infrared imaging devices to detect underdrawing and reworking of paintings. System analyses have been performed on two different ' near-infrared imaging devices: a Hamamatsu lead sulphide vidicon camera and a Photometries silicon charge coupled device (CCD) camera. The analyses included modelling of the system spectral response curve by analysis of the system components, as well as considering the limiting resolution and modulation transfer function (MTF). The modelling was confirmed by examination of a test panel at various wavelengths. Calculation of visibility is introduced as a quantitative measure of system performance. This calculation is also discussed as a means to define more clearly the actual performance requirements of these systems. This analysis has revealed the strengths and weaknesses of current systems, and provides guidance in the construction of improved devices.

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