Surface characterization of Cux/2Cd1−xIn2+x/2S4 model catalysts
- 1 July 1990
- journal article
- Published by Wiley in Surface and Interface Analysis
- Vol. 16 (1-12) , 352-358
- https://doi.org/10.1002/sia.740160175
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Charge distribution and local and non‐local screening effects studied by means of the Auger parameter and chemical state plotsSurface and Interface Analysis, 1990
- Auger parameter and chemical state plots for copper- and zinc-containing compounds: charge distribution and screening effectsJournal of Physics: Condensed Matter, 1989
- Characterization of CuO–ZnO catalysts by X‐ray photoelectron spectroscopy: Precursors, calcined and reduced samplesSurface and Interface Analysis, 1989
- The surface chemistry of sulphur compoundsSurface and Interface Analysis, 1987
- X-ray photoelectron and Auger spectroscopic studies of Cu2S and CuSJournal of Materials Science Letters, 1986
- Final-state screening and chemical shifts in photoelectron spectroscopyPhysical Review B, 1985
- Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisSurface and Interface Analysis, 1981
- Satellite structure in photoelectron and Auger spectra of copper dihalidesPhysical Review B, 1981
- Reactions on sulphide catalystsPublished by Royal Society of Chemistry (RSC) ,1977
- Transition metal sulfidesProgress in Solid State Chemistry, 1976