Determination of proper frequency bandwidth for 3D topography measurement using spectral analysis. Part I: isotropic surfaces
- 1 July 1993
- Vol. 166 (2) , 221-232
- https://doi.org/10.1016/0043-1648(93)90265-n
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
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- Machined surfaces: Final texture and underlying structureWear, 1982
- An optimum sampling interval for digitizing surface asperity profilesWear, 1982
- rms skew and kurtosis of surface profile height distributions: some aspects of sample variationPrecision Engineering, 1980
- Surface topography as a nonstationary random processNature, 1978